000 00260nam a2200109Ia 4500
008 160710s2003 xx 000 0 und d
100 _aKAPUR,R.
245 _aCTL FOR TEST INF. OF DIGITAL ICs
260 _bKLUWER ACAD.
_c2003
300 _a173
942 _2ddc
_cB
999 _c58322
_d58322