000 00280nam a2200109Ia 4500
008 160710s1999 xx 000 0 und d
082 _a621.3815 CRO
100 _aCROUCH,A.L.
245 _aDESIGN FOR TEST FOR DIGITAL IC's EMBEDDED CORE SYSTEMS
260 _c1999
942 _2ddc
_cB
999 _c56684
_d56684