6T SRAM HIGH DENSITY BIT-CELL ANALYSIS FOR 1PPM FAILURE RATE TARGETTING TEMPERATURE (-40,165)

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TextPublication details: DELHI TECHNOLOGICAL UNIVERSITY 2018Description: 58Subject(s):

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Dissertation note: M.TECH 2018 DR. RAJESH ROHILLA

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Item type	Current library	Call number	Status	Date due	Barcode
Elec. Thesis & Dissertation	Delhi Technological University	621.382 SIN (Browse shelf(Opens below))	Not for loan		TD-4342

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Previous	621.382 SIN BLOCK-BASED DISCRETE WAVELET TRANSFORM SINGULAR VALUE DECOMPOSITION IMAGE WATERMARKING SCHEME USING HUMAN VISUAL SYSTEM CHARACTERISTICS AND FIREFLY ALGORITHM	621.382 SIN IMAGE COMPRESSION USING HYBRID BTC AND DCT TECHNIQUE	621.382 SIN REALIZATION OF CDTA BASED INCREMNETAL/DECREMENTAL TYPE MEMRISTOR EMULATOR CIRCUIT	621.382 SIN 6T SRAM HIGH DENSITY BIT-CELL ANALYSIS FOR 1PPM FAILURE RATE TARGETTING TEMPERATURE (-40,165)	621.382 SIR NOVEL TECHNIQUE FOREGROUND SEGMENTS..	621.382 SKL DIGITAL COMMUNICATIONS	621.382 SKL DIGITAL COMMUNICATIONS	Next

M.TECH 2018 DR. RAJESH ROHILLA

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